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voltage regulators 1 an79nxx series 3-pin negative output voltage regulator (300 ma type) overview the an79nxx series is a 3-pin, fixed negative output type monolithic voltage regulator. stabilized fixed output voltage is obtained from unstable dc input voltage with- out using any external component ic. 12 types of output voltage are available: ? 4v, ? 5v, ? 6v, ? 7v, ? 8v, ? 9v, ? 10v, ? 12v, ? 15v, ? 18v, ? 20v and ? 24v. they can be used widely in power circuits with current capacity of up to 300ma. features ? no external components ? output voltage: ? 4v, ? 5v, ? 6v, ? 7v, ? 8v, ? 9v, ? 10v, ? 12v, ? 15v, ? 18v, ? 20v, ? 24v ? built-in overcurrent limit circuit ? built-in thermal overload protection circuit ? built-in aso (area of safe operation) protection circuit ssip003-p-0000e an79nxx series unit : mm block diagram 1 : common 2 : input 3 : output 8.0 3.05 3.8 10.80.3 15.0 min. 0.750.25 0.50.1 0.50.25 2.3 4.6 1.76 1.44 3.5 max. 1.94 +0.5 ?0.1 123 1 3 2 common output input starter voltage reference error amp. + ? r 1 q 1 pass tr r sc current limiter thermal protection r 2 maintenance/ discontinued maintenance/discontinued includes following four product lifecycle stage. planed maintenance type maintenance type planed discontinued typed discontinued type please visit following url about latest information. http://panasonic.net/sc/en
an79nxx series voltage regulators 2 absolute maximum ratings at t a 25 c electrical characteristics at t a 25 c an79n04 ( 4v type) v i p d t opr t stg v v w c c parameter symbol rating unit 35 * 1 40 * 2 8 * 3 20 to 80 55 to 150 input voltage power dissipation operating ambient temperature storage temperature * 1 an79n04, an79n05, an79n06, AN79N07, an79n08, an79n09, an79n10, an79n12, an79n15, an79n18 * 2 an79n20, an79n24 * 3 follow the derating curve. when t j exceeds 150 c, the internal circuit cuts off the output. parameter symbol conditions min typ max output voltage v o 4.16 v 4 t j 25 c output voltage tolerance v o v v i 6 to 25v, i o 5 to 200ma line regulation reg in 40 mv 9 v i 6 to 25v, t j 25 c mv load regulation reg l mv 20 i o 1 to 300ma, t j 25 c mv i o 5 to 200ma, t j 25 c v i 7 to 17v, t j 25 c ma 3 t j 25 c note 1) the specified condition t j 25 c means that the test should be carried out within so short a test time (within 10ms) that the characteristic value drift due to the chip junction temperature rise can be ignored. note 2) unless otherwise specified, v i 9v, i o 100ma, c i 2 f, c o 1 f and t j 0 to 125 c 4 bias current i bias ma v i 7 to 25v, t j 25 c bias current fluctuation to input i bias(in) ma bias current fluctuation to load i bias(l) v 100 i o 5 to 200ma, t j 25 c output noise voltage v no db f 10hz to 100khz 0.5 0.1 20 4.2 80 40 5 60 3.84 3.8 ripple rejection ratio rr v i 7 to 17v, i o 50ma, f 120hz v 1.1 i o 200ma, t j 25 c minimum input/output voltage difference v dif(min) ma 10 output short-circuit current i o(short) ma 500 v i 35v, t j 25 c 10 peak output current i o(peak) t j 25 c mv/ c 0.4 output voltage temperature coefficient v o /t a i o 5ma unit
voltage regulators an79nxx series 3 electrical characteristics at t a 25 c (continued) an79n05 ( 5v type) an79n06 ( 6v type) v o v t j 25 c v o v v i 7 to 25v, i o 5 to 200ma reg in mv v i 7 to 25v, t j 25 c mv reg l mv i o 1 to 300ma, t j 25 c mv i o 5 to 200ma, t j 25 c v i 8 to 18v, t j 25 c ma t j 25 c i bias ma v i 8 to 25v, t j 25 c i bias(in) ma i bias(l) v i o 5 to 200ma, t j 25 c v no db f 10hz to 100khz rr v i 8 to 18v, i o 50ma, f 120hz v i o 200ma, t j 25 c v dif(min) ma i o(short) ma v i 35v, t j 25 c i o(peak) t j 25 c mv/ c v o /t a i o 5ma 5.2 5 50 10 20 3 5 125 0.5 0.1 30 5.25 100 50 5 60 4.8 4.75 1.1 10 500 10 0.4 parameter symbol conditions min typ max output voltage output voltage tolerance line regulation load regulation note 1) the specified condition t j 25 c means that the test should be carried out within so short a test time (within 10ms) that the characteristic value drift due to the chip junction temperature rise can be ignored. note 2) unless otherwise specified, v i 10v, i o 100ma, c i 2 f, c o 1 f and t j 0 to 125 c bias current bias current fluctuation to input bias current fluctuation to load output noise voltage ripple rejection ratio minimum input/output voltage difference output short-circuit current peak output current output voltage temperature coefficient unit v o v t j 25 c v o v v i 8 to 25v, i o 5 to 200ma reg in mv v i 8 to 25v, t j 25 c mv reg l mv i o 1 to 300ma, t j 25 c mv i o 5 to 200ma, t j 25 c v i 9 to 19v, t j 25 c ma t j 25 c i bias ma v i 9 to 25v, t j 25 c i bias(in) ma i bias(l) v i o 5 to 200ma, t j 25 c v no db f 10hz to 100khz rr v i 9 to 19v, i o 50ma, f 120hz v i o 5ma, t j 0 to 125 c v dif(min) ma i o(short) ma v i 35v, t j 25 c i o(peak) t j 25 c mv/ c v o /t a i o 200ma 6.25 6 60 11 20 3 6 150 0.5 0.1 40 6.3 120 60 5 60 5.75 5.7 1.1 10 500 10 0.4 parameter symbol conditions min typ max output voltage output voltage tolerance line regulation load regulation note 1) the specified condition t j 25 c means that the test should be carried out within so short a test time (within 10ms) that the characteristic value drift due to the chip junction temperature rise can be ignored. note 2) unless otherwise specified, v i 11v, i o 100ma, c i 2 f, c o 1 f and t j 0 to 125 c bias current bias current fluctuation to input bias current fluctuation to load output noise voltage ripple rejection ratio minimum input/output voltage difference output short-circuit current peak output current output voltage temperature coefficient unit
an79nxx series voltage regulators 4 electrical characteristics at t a 25 c (continued) AN79N07 ( 7v type) an79n08 ( 8v type) v o v t j 25 c v o v v i 9 to 25v, i o 5 to 200ma reg in mv v i 9 to 25v, t j 25 c mv reg l mv i o 1 to 300ma, t j 25 c mv i o 5 to 200ma, t j 25 c v i 10 to 20v, t j 25 c ma t j 25 c i bias ma v i 10 to 25v, t j 25 c i bias(in) ma i bias(l) v i o 5 to 200ma, t j 25 c v no db f 10hz to 100khz rr v i 10 to 20v, i o 50ma, f 120hz v i o 200ma, t j 25 c v dif(min) ma i o(short) ma v i 35v, t j 25 c i o(peak) t j 25 c mv/ c v o /t a i o 5ma 7.3 7 70 12 20 3 7 175 0.5 0.1 35 7.35 140 70 5 59 6.7 6.65 1.1 10 500 10 0.5 parameter symbol conditions min typ max output voltage output voltage tolerance line regulation load regulation note 1) the specified condition t j 25 c means that the test should be carried out within so short a test time (within 10ms) that the characteristic value drift due to the chip junction temperature rise can be ignored. note 2) unless otherwise specified, v i 12v, i o 100ma, c i 2 f, c o 1 f and t j 0 to 125 c bias current bias current fluctuation to input bias current fluctuation to load output noise voltage ripple rejection ratio minimum input/output voltage difference output short-circuit current peak output current output voltage temperature coefficient unit v o v t j 25 c v o v v i 10.5 to 25v, i o 5 to 200ma reg in mv v i 10.5 to 25v, t j 25 c mv reg l mv i o 1 to 300ma, t j 25 c mv i o 5 to 200ma, t j 25 c v i 11 to 21v, t j 25 c ma t j 25 c i bias ma v i 10.5 to 25v, t j 25 c i bias(in) ma i bias(l) v i o 5 to 200ma, t j 25 c v no db f 10hz to 100khz rr v i 11.5 to 21.5v, i o 50ma, f 120hz v i o 200ma, t j 25 c v dif(min) ma i o(short) ma v i 35v, t j 25 c i o(peak) t j 25 c mv/ c v o /t a i o 5ma 8.3 8 80 13 25 3 8 200 0.5 0.1 40 8.4 160 80 5 59 7.7 7.6 1.1 10 500 10 0.6 parameter symbol conditions min typ max output voltage output voltage tolerance line regulation load regulation note 1) the specified condition t j 25 c means that the test should be carried out within so short a test time (within 10ms) that the characteristic value drift due to the chip junction temperature rise can be ignored. note 2) unless otherwise specified, v i 14v, i o 100ma, c i 2 f, c o 1 f and t j 0 to 125 c bias current bias current fluctuation to input bias current fluctuation to load output noise voltage ripple rejection ratio minimum input/output voltage difference output short-circuit current peak output current output voltage temperature coefficient unit
voltage regulators an79nxx series 5 electrical characteristics at t a 25 c (continued) an79n09 ( 9v type) an79n10 ( 10v type) v o v t j 25 c v o v v i 11.5 to 26v, i o 5 to 200ma reg in mv v i 11.5 to 26v, t j 25 c mv reg l mv i o 1 to 300ma, t j 25 c mv i o 5 to 200ma, t j 25 c v i 12 to 22v, t j 25 c ma t j 25 c i bias ma v i 11.5 to 26v, t j 25 c i bias(in) ma i bias(l) v i o 5 to 200ma, t j 25 c v no db f 10hz to 100khz rr v i 12 to 22v, i o 50ma, f 120hz v i o 200ma, t j 25 c v dif(min) ma i o(short) ma v i 35v, t j 25 c i o(peak) t j 25 c mv/ c v o /t a i o 5ma 9.35 9 80 14 25 3 9 225 0.5 0.1 50 9.45 180 90 5 58 8.65 8.55 1.1 10 500 10 0.6 parameter symbol conditions min typ max output voltage output voltage tolerance line regulation load regulation note 1) the specified condition t j 25 c means that the test should be carried out within so short a test time (within 10ms) that the characteristic value drift due to the chip junction temperature rise can be ignored. note 2) unless otherwise specified, v i 15v, i o 100ma, c i 2 f, c o 1 f and t j 0 to 125 c bias current bias current fluctuation to input bias current fluctuation to load output noise voltage ripple rejection ratio minimum input/output voltage difference output short-circuit current peak output current output voltage temperature coefficient unit v o v t j 25 c v o v v i 12.5 to 27v, i o 5 to 200ma reg in mv v i 12.5 to 27v, t j 25 c mv reg l mv i o 1 to 300ma, t j 25 c mv i o 5 to 200ma, t j 25 c v i 13 to 23v, t j 25 c ma t j 25 c i bias ma v i 12.5 to 27v, t j 25 c i bias(in) ma i bias(l) v i o 5 to 200ma, t j 25 c v no db f 10hz to 100khz rr v i 13 to 23v, i o 50ma, f 120hz v i o 200ma, t j 25 c v dif(min) ma i o(short) ma v i 35v, t j 25 c i o(peak) t j 25 c mv/ c v o /t a i o 5ma 10.4 10 80 15 25 3.0 10 250 0.5 0.1 50 10.5 200 100 5 58 9.6 9.5 1.1 10 500 10 0.7 parameter symbol conditions min typ max output voltage output voltage tolerance line regulation load regulation note 1) the specified condition t j 25 c means that the test should be carried out within so short a test time (within 10ms) that the characteristic value drift due to the chip junction temperature rise can be ignored. note 2) unless otherwise specified, v i 16v, i o 100ma, c i 2 f, c o 1 f and t j 0 to 125 c bias current bias current fluctuation to input bias current fluctuation to load output noise voltage ripple rejection ratio minimum input/output voltage difference output short-circuit current peak output current output voltage temperature coefficient unit
an79nxx series voltage regulators 6 electrical characteristics at t a 25 c (continued) an79n12 ( 12v type) an79n15 ( 15v type) v o v t j 25 c v o v v i 17.5 to 30v, i o 5 to 200ma reg in mv v i 17.5 to 30v, t j 25 c mv reg l mv i o 1 to 300ma, t j 25 c mv i o 5 to 200ma, t j 25 c v i 18 to 28v, t j 25 c ma t j 25 c i bias ma v i 17.5 to 30v, t j 25 c i bias(in) ma i bias(l) v i o 5 to 200ma, t j 25 c v no db f 10hz to 100khz rr v i 18 to 28v, i o 50ma, f 120hz v i o 200ma, t j 25 c v dif(min) ma i o(short) ma v i 35v, t j 25 c i o(peak) t j 25 c mv/ c v o /t a i o 5ma 15.6 15 80 16 25 3 11 375 0.5 0.1 50 15.75 240 120 5 56 14.4 14.25 1.1 10 500 10 0.9 parameter symbol conditions min typ max output voltage output voltage tolerance line regulation load regulation note 1) the specified condition t j 25 c means that the test should be carried out within so short a test time (within 10ms) that the characteristic value drift due to the chip junction temperature rise can be ignored. note 2) unless otherwise specified, v i 23v, i o 100ma, c i 2 f, c o 1 f and t j 0 to 125 c bias current bias current fluctuation to input bias current fluctuation to load output noise voltage ripple rejection ratio minimum input/output voltage difference output short-circuit current peak output current output voltage temperature coefficient unit v o v t j 25 c v o v v i 14.5 to 30v, i o 5 to 200ma reg in mv v i 14.5 to 30v, t j 25 c mv reg l mv i o 1 to 300ma, t j 25 c mv i o 5 to 200ma, t j 25 c v i 15 to 25v, t j 25 c ma t j 25 c i bias ma v i 14.5 to 30v, t j 25 c i bias(in) ma i bias(l) v i o 5 to 200ma, t j 25 c v no db f 10hz to 100khz rr v i 15 to 25v, i o 50ma, f 120hz v i o 200ma, t j 25 c v dif(min) ma i o(short) ma v i 35v, t j 25 c i o(peak) t j 25 c mv/ c v o /t a i o 5ma 12.5 12 80 15 25 3 10 300 0.5 0.1 50 12.6 240 120 5 57 11.5 11.4 1.1 10 500 10 0.8 parameter symbol conditions min typ max output voltage output voltage tolerance line regulation load regulation note 1) the specified condition t j 25 c means that the test should be carried out within so short a test time (within 10ms) that the characteristic value drift due to the chip junction temperature rise can be ignored. note 2) unless otherwise specified, v i 19v, i o 100ma, c i 2 f, c o 1 f and t j 0 to 125 c bias current bias current fluctuation to input bias current fluctuation to load output noise voltage ripple rejection ratio minimum input/output voltage difference output short-circuit current peak output current output voltage temperature coefficient unit
voltage regulators an79nxx series 7 electrical characteristics at t a 25 c (continued) an79n18 ( 18v type) an79n20 ( 20v type) v o v t j 25 c v o v v i 21 to 33v, i o 5 to 200ma reg in mv v i 21 to 33v, t j 25 c mv reg l mv i o 1 to 300ma, t j 25 c mv i o 5 to 200ma, t j 25 c v i 22 to 32v, t j 25 c ma t j 25 c i bias ma v i 21 to 33v, t j 25 c i bias(in) ma i bias(l) v i o 5 to 200ma, t j 25 c v no db f 10hz to 100khz rr v i 22 to 32v, i o 50ma, f 120hz v i o 200ma, t j 25 c v dif(min) ma i o(short) ma v i 35v, t j 25 c i o(peak) t j 25 c mv/ c v o /t a i o 5ma 18.7 18 80 18 30 3 13 450 0.5 0.1 50 18.9 300 150 5 55 17.3 17.1 1.1 10 500 10 1 parameter symbol conditions min typ max output voltage output voltage tolerance line regulation load regulation note 1) the specified condition t j 25 c means that the test should be carried out within so short a test time (within 10ms) that the characteristic value drift due to the chip junction temperature rise can be ignored. note 2) unless otherwise specified, v i 27v, i o 100ma, c i 2 f, c o 1 f and t j 0 to 125 c bias current bias current fluctuation to input bias current fluctuation to load output noise voltage ripple rejection ratio minimum input/output voltage difference output short-circuit current peak output current output voltage temperature coefficient unit v o v t j 25 c v o v v i 23 to 35v, i o 5 to 200ma reg in mv v i 23 to 35v, t j 25 c mv reg l mv i o 1 to 300ma, t j 25 c mv i o 5 to 200ma, t j 25 c v i 24 to 34v, t j 25 c ma t j 25 c i bias ma v i 23 to 35v, t j 25 c i bias(in) ma i bias(l) v i o 5 to 200ma, t j 25 c v no db f 10hz to 100khz rr v i 24 to 34v, i o 50ma, f 120hz v i o 200ma, t j 25 c v dif(min) ma i o(short) ma v i 35v, t j 25 c i o(peak) t j 25 c v o /t a i o 5ma 20.8 20 80 19 30 3 14 500 0.5 0.1 70 21 300 150 5 54 19.2 19 1.1 10 500 10 1 mv/ c parameter symbol conditions min typ max output voltage output voltage tolerance line regulation load regulation note 1) the specified condition t j 25 c means that the test should be carried out within so short a test time (within 10ms) that the characteristic value drift due to the chip junction temperature rise can be ignored. note 2) unless otherwise specified, v i 29v, i o 100ma, c i 2 f, c o 1 f and t j 0 to 125 c bias current bias current fluctuation to input bias current fluctuation to load output noise voltage ripple rejection ratio minimum input/output voltage difference output short-circuit current peak output current output voltage temperature coefficient unit
an79nxx series voltage regulators 8 electrical characteristics at t a 25 c (continued) an79n24 ( 24v type) main characteristics v o v t j 25 c v o v v i 27 to 38v, i o 5 to 200ma reg in mv v i 27 to 38v, t j 25 c mv reg l mv i o 1 to 300ma, t j 25 c mv i o 5 to 200ma, t j 25 c v i 27 to 37v, t j 25 c ma t j 25 c i bias ma v i 27 to 38v, t j 25 c i bias(in) ma i bias(l) v i o 5 to 200ma, t j 25 c v no db f 10hz to 100khz rr v i 28 to 38v, i o 50ma, f 120hz v i o 200ma, t j 25 c v dif(min) ma i o(short) ma v i 35v, t j 25 c i o(peak) t j 25 c mv/ c v o /t a i o 5ma 25 24 80 20 30 3 15 600 0.5 0.1 70 25.2 300 150 5 54 23 22.8 1.1 10 500 10 1 parameter symbol conditions min typ max output voltage output voltage tolerance line regulation load regulation note 1) the specified condition t j 25 c means that the test should be carried out within so short a test time (within 10ms) that the characteristic value drift due to the chip junction temperature rise can be ignored. note 2) unless otherwise specified, v i 33v, i o 100ma, c i 2 f, c o 1 f and t j 0 to 125 c bias current bias current fluctuation to input bias current fluctuation to load output noise voltage ripple rejection ratio minimum input/output voltage difference output short-circuit current peak output current output voltage temperature coefficient unit 0246810 time t ( s) 10 0 10 20 20 15 10 5 output voltage fluctuation (mv) input voltage v i (v) input transient response an79n05 10 8 6 4 2 0 0 40 80 120 160 ambient temperature t a ( c) power dissipation p d (w) p d t a (1) (2) (3) (4) 1.4 1.2 1.0 0.8 0.6 0.4 50 0 50 100 150 junction temperature t j ( c) minimum input/output voltage difference v dif(min) (v) v dif(min) t j i o 300ma i o 100ma i o 50ma i o 5ma an79n05 (1) infinite heat sink (2) 5 c/w heat sink (3) 15 c/w heat sink (4) without heat sink r th(j-c) 15 c/w (max.) r th(j-a) 100 c/w (max.)
voltage regulators an79nxx series 9 main characteristics (continued) basic regulator circuit c o c i input v i v o output an79nxx common connect c i of 2 f when the input line is long. c o improves the transient response. 1 f 120 100 80 60 40 20 0 10 100 an79n05 i o 50ma 1k 10k 100k frequency f (hz) ripple rejection ratio rr (db) rr f 0 1020304050 time t ( s) 1 0 1 2 0.6 0.3 0 output voltage fluctuation (v) load current i o (a) load transient response an79n05 usage notes 1. cautions for a basic circuit c i : when a wiring from a smoothing circuit to a three-pin regulator is long, it is likely to oscillate at output. a capacitor of 0.1 f to 0.47 f should be connected near an input pin. c o : deadly needed to prevent from oscillation (0.33 f to 1.0 f). it is recommended to use a capacitor of a small internal imped- ance (ex. tantalum capacitor) when using it under a low tem- perature. when any sudden change of load current is likely to occur, con- nect an electrolytic capacitor of 10 f to 100 f to improve a transitional response of output voltage. d i : normally unnecessary. but add it in the case that there is a residual voltage at the output capacitor co even after switching off the supply power because a current is likely to flow into an output pin of the ic and damage the ic. figure 1 c o v o c i v i d i 1 3 2
an79nxx series voltage regulators 10 2 f 1 f i q i o an79nxx r v o ' v i input common output
i o i q r v o ' usage notes (continued) 2. other caution items 1) short-circuit between the input pin and gnd pin if the input pin is short-circuitted to gnd or is cut off when a large capacitance capacitor has been con- nected to the ic's load, a voltage of a capacitor con- nected to an output pin is applied between input/out- put of the ic and this likely results in damage of the ic. it is necessary, therefore, to connect a diode, as shown in figure 2, to counter the reverse bias between input/output pins. 2) floating of gnd pin if a gnd pin is made floating in an operating mode, an unstabilized input voltage is outputted. in this case, a thermal protection circuit inside the ic does not normally operate. in this state, if the load is short-circuited or overloaded, it is likely to damage the ic. application circuit example in gnd out figure 2 c o output 1 3 2
request for your special attention and precautions in using the technical information and semiconductors described in this book (1) if any of the products or technical information described in this book is to be exported or provided to non-residents, the laws and regulations of the exporting country, especially, those with regard to security export control, must be observed. (2) the technical information described in this book is intended only to show the main characteristics and application circuit examples of the products, and no license is granted under any intellectual property right or other right owned by our company or any other company. therefore, no responsibility is assumed by our company as to the infringement upon any such right owned by any other company which may arise as a result of the use of technical information described in this book. (3) the products described in this book are intended to be used for standard applications or general electronic equipment (such as office equipment, communications equipment, measuring instruments and household appliances). consult our sales staff in advance for information on the following applications: ? special applications (such as for airplanes, aerospace, automobiles, traffic control equipment, combustion equipment, life support systems and safety devices) in which exceptional quality and reliability are required, or if the failure or malfunction of the prod- ucts may directly jeopardize life or harm the human body. ? any applications other than the standard applications intended. (4) the products and product specifications described in this book are subject to change without notice for modification and/or im- provement. at the final stage of your design, purchasing, or use of the products, therefore, ask for the most up-to-date product standards in advance to make sure that the latest specifications satisfy your requirements. (5) when designing your equipment, comply with the range of absolute maximum rating and the guaranteed operating conditions (operating power supply voltage and operating environment etc.). especially, please be careful not to exceed the range of absolute maximum rating on the transient state, such as power-on, power-off and mode-switching. otherwise, we will not be liable for any defect which may arise later in your equipment. even when the products are used within the guaranteed values, take into the consideration of incidence of break down and failure mode, possible to occur to semiconductor products. measures on the systems such as redundant design, arresting the spread of fire or preventing glitch are recommended in order to prevent physical injury, fire, social damages, for example, by using the products. (6) comply with the instructions for use in order to prevent breakdown and characteristics change due to external factors (esd, eos, thermal stress and mechanical stress) at the time of handling, mounting or at customer's process. when using products for which damp-proof packing is required, satisfy the conditions, such as shelf life and the elapsed time since first opening the packages. (7) this book may be not reprinted or reproduced whether wholly or partially, without the prior written permission of matsushita electric industrial co., ltd.

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